651. | MBE of InSb for focal plane arrays SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
652. | Growth models of GaN thin films based on crystal chemistry SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
653. | InAsSb/InAsSbP high-power laser diodes emitting 3-5 µm range on InAs and GaSb substrates SPIE Photonics West '97, Integrated Optics Devices: Potential and Commercialization Conference San Jose, CA -- February 8, 1997 |
654. | Temperature insensitivity of the Al-free InGaAs(P)/GaAs lasers for l = 808 and 980 nm SPIE Photonics West '97, In-Plane Semiconductor Lasers San Jose, CA -- February 8, 1997 |
655. | InSb growth on (111) and (100) GaAs and Si substrates for near room temperature focal plane arrays SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
656. | InTlSb and InAsSb for 8-12 µm near room temperature operation SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
657. | Very long wavelength GaAs/GaInP quantum Weiol infrared photodetectors SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
658. | AlGaN ultraviolet detectors SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
659. | Intrinsic AlGaN photoconductors for the entire compositional range SPIE Photonics West '97, Photodetectors: Materials and Devices II San Jose, CA -- February 8, 1997 |
660. | Infrared Imaging Arrays Using Advanced III-V Materials Advanced Workshop on Frontiers in Electronics (WOFE) Canary Islands, Spain -- January 6, 1997 |
661. | High Power InAsSb/InAsSbP Laser Diodes Emitting at 3-5 µm Range Materials Research Society Fall Meeting Boston, MA -- December 2, 1996 |
662. | GaInAsP/GaAs Quantum Well Intrasubband Photodetectors (QWIPs) for 8-12 µm Focal Plane Array Infrared Imaging Materials Research Society Fall Meeting Boston, MA -- December 2, 1996 |
663. | Very Low Dislocation Densities in GaN-AlGaN Heterostructures, Materials Research Society Fall Meeting Boston, MA -- December 2, 1996 |
664. | High Resolution X-Ray Diffraction of GaN Grown on Sapphire Substrates Materials Research Society Fall Meeting Boston, MA -- December 2, 1996 |
665. | Growth of InSb on GaAs and Si for Infrared Imaging Focal Plane Arrays Materials Research Society Fall Meeting Boston, MA -- December 2, 1996 |
666. | Recent Advances in III-Nitride Materials, Characterization and Device Applications 8th Seoul International Symposium on the Physics of Semiconductors and Applications (ISPSA-96) Seoul, Korea -- October 21, 1996 |
667. | Sb-based Infrared FPA on GaAs and Si DARPA/ETO Optoelectronics Program Review Orlando, FL -- October 7, 1996 |
668. | Recent Advances in III-Nitride Materials, Characterization and Device Applications XII Conference on Solid State Crystals, Materials Science and Applications Zakopane, Poland -- October 7, 1996 |
669. | III-V Interband and Intraband Far-Infrared Detectors 23rd International Symposium on Compound Semiconductors St. Petersburg, Russia -- September 23, 1996 |
670. | GaAs-GaInP(As) p-type and n-type QWIPs Air Force Office of Scientific Research Semiconductor and Electromagnetic Materials Review Wright-Patterson AFB, OH -- August 22, 1996 |
671. | Epitaxial Growth of III-V Nitride Wide Bandgap Semiconductors Air Force Wright Laboratory Wright-Patterson AFB, OH -- June 17, 1996 |
672. | Sb-based Infrared Photodetectors and Focal Plane Arrays for Operation in the 3-14 µm Range CLEO/QELS '96 Anaheim, CA -- June 2, 1996 |
673. | MOCVD Growth of High Quality GaN-AlGaN Based Structures on Al2O3 Substrates with Dislocation Density Less than 10^7 cm^-2 International Symposium on Nitrides St. Malo, France -- May 29, 1996 |
674. | Development of III-Nitride Technology for Optoelectronic Devices DARPA/ETO GaN Workshop Reston, VA -- May 9, 1996 |
675. | MOCVD Growth of InAsSb(P)-InAs Based Alloys for Long Wavelength Lasers IEEE 9th International Conference on Semiconducting and Insulating Materials Toulouse, France -- April 29, 1996 |